Title :
A 2.98nW bandgap voltage reference using a self-tuning low leakage sample and hold
Author :
Chen, Yen-Po ; Fojtik, Matt ; Blaauw, David ; Sylvester, Dennis
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
A novel low power bandgap voltage reference using a sample and hold circuit with self-calibrating duty cycle and leakage compensation is presented. Measurements of 0.18μm CMOS test chips show a temperature coefficient of 24.7ppm/°C and power consumption of 2.98nW, marking a 251× power reduction over the previous lowest power bandgap reference.
Keywords :
CMOS analogue integrated circuits; energy gap; low-power electronics; reference circuits; sample and hold circuits; CMOS test chips; leakage compensation; low power bandgap voltage reference; power 2.98 nW; power consumption; power reduction; self-calibrating duty cycle; self-tuning low leakage sample and hold circuit; size 0.18 mum; temperature coefficient; Capacitors; Gate leakage; Photonic band gap; Power demand; Temperature measurement; Tuning;
Conference_Titel :
VLSI Circuits (VLSIC), 2012 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4673-0848-9
Electronic_ISBN :
978-1-4673-0845-8
DOI :
10.1109/VLSIC.2012.6243859