• DocumentCode
    2662465
  • Title

    A New 1MHz-2GHz Permeance Meter For Metallic Thin Films

  • Author

    Yamaguchi, M. ; Yabukami, S. ; Arai, K.I.

  • Author_Institution
    Tohoku University
  • fYear
    1997
  • fDate
    1-4 April 1997
  • Keywords
    Area measurement; Conductive films; Current measurement; Frequency measurement; Impedance measurement; Length measurement; Permeability measurement; Q measurement; Thickness measurement; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
  • Conference_Location
    New Orleans, LA, USA
  • Print_ISBN
    0-7803-3862-6
  • Type

    conf

  • DOI
    10.1109/INTMAG.1997.597762
  • Filename
    597762
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2662465