DocumentCode :
2662465
Title :
A New 1MHz-2GHz Permeance Meter For Metallic Thin Films
Author :
Yamaguchi, M. ; Yabukami, S. ; Arai, K.I.
Author_Institution :
Tohoku University
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Area measurement; Conductive films; Current measurement; Frequency measurement; Impedance measurement; Length measurement; Permeability measurement; Q measurement; Thickness measurement; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597762
Filename :
597762
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2662465
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