2662490

The Promise of Known-good-die Technologies

Vasquez, Barbara ; Lindsey, Scott

MOTOROLA, AZ

1994

13-15 Apr 1994

1

6

Application specific integrated circuits; Automatic testing; CMOS technology; Circuit testing; Contacts; Fixtures; Integrated circuit testing; Manufacturing industries; Semiconductor device manufacture; Semiconductor device packaging;

English

ieee

Multichip Modules, 1994. Proceedings of the 1994 International Conference on

0-930815-39-4

conf

10.1109/ICMCM.1994.753521

753521