Title :
Development of a Burn-in and Test Process for Producing Known-Good-Die
Author :
Prokopchak, Lina ; Wrenn, James M.
Author_Institution :
Aehr Test Systems, CA
Keywords :
Automatic testing; Conductive films; Contacts; Costs; Integrated circuit testing; Packaging machines; Semiconductor device manufacture; Sockets; Substrates; System testing;
Conference_Titel :
Multichip Modules, 1994. Proceedings of the 1994 International Conference on
Print_ISBN :
0-930815-39-4
DOI :
10.1109/ICMCM.1994.753524
