Title :
Applications of Latent Open Test
Author :
Economikos, Laertis ; Chiang, Shinwu ; Halperin, Arnold
Author_Institution :
IBM Microelectronics, NY
Keywords :
Conductors; Detectors; Frequency; Manufacturing processes; Multichip modules; Nonlinear distortion; Phase detection; Phase distortion; Strips; Testing;
Conference_Titel :
Multichip Modules, 1994. Proceedings of the 1994 International Conference on
Print_ISBN :
0-930815-39-4
DOI :
10.1109/ICMCM.1994.753552
