DocumentCode
2662982
Title
High speed linear CCD sensors with pinned photodiode photosites
Author
Fox, Eric C. ; O, Nixon ; Dykaar, Douglas R. ; Mantell, Tony J. ; Sabila, Robert W.
Author_Institution
DALSA Inc., Waterloo, Ont., Canada
Volume
2
fYear
1998
fDate
24-28 May 1998
Firstpage
649
Abstract
In this work we describe two families of linear image sensors which incorporate pinned photodiode (PPD) photosites. In a PPD photosite the n+ region of the conventional photodiode is replaced by an n region and a shallow highly doped p region. The high quantum efficiencies associated with conventional photodiodes are maintained while allowing for large reductions in image lag and fixed pattern noise which are associated with conventional photodiodes
Keywords
CCD image sensors; p-i-n photodiodes; PPD photosites; fixed pattern noise; high speed linear CCD sensors; image lag; linear image sensors; n region; n+ region; pinned photodiode photosites; quantum efficiencies; shallow highly doped p region; Charge coupled devices; Chromium; Degradation; Diodes; Displays; Electronic mail; Image sensors; Noise reduction; Photodiodes; Sensor phenomena and characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 1998. IEEE Canadian Conference on
Conference_Location
Waterloo, Ont.
ISSN
0840-7789
Print_ISBN
0-7803-4314-X
Type
conf
DOI
10.1109/CCECE.1998.685580
Filename
685580
Link To Document