Title :
High speed linear CCD sensors with pinned photodiode photosites
Author :
Fox, Eric C. ; O, Nixon ; Dykaar, Douglas R. ; Mantell, Tony J. ; Sabila, Robert W.
Author_Institution :
DALSA Inc., Waterloo, Ont., Canada
Abstract :
In this work we describe two families of linear image sensors which incorporate pinned photodiode (PPD) photosites. In a PPD photosite the n+ region of the conventional photodiode is replaced by an n region and a shallow highly doped p region. The high quantum efficiencies associated with conventional photodiodes are maintained while allowing for large reductions in image lag and fixed pattern noise which are associated with conventional photodiodes
Keywords :
CCD image sensors; p-i-n photodiodes; PPD photosites; fixed pattern noise; high speed linear CCD sensors; image lag; linear image sensors; n region; n+ region; pinned photodiode photosites; quantum efficiencies; shallow highly doped p region; Charge coupled devices; Chromium; Degradation; Diodes; Displays; Electronic mail; Image sensors; Noise reduction; Photodiodes; Sensor phenomena and characterization;
Conference_Titel :
Electrical and Computer Engineering, 1998. IEEE Canadian Conference on
Conference_Location :
Waterloo, Ont.
Print_ISBN :
0-7803-4314-X
DOI :
10.1109/CCECE.1998.685580
