2662994

Boundary Scan Techniques in an Mcm-D Application

Hilla, Stephen C.

Environmental Research Institute of Michigan

1994

13-15 Apr 1994

217

222

Circuit testing; Electronic equipment testing; Image processing; Integrated circuit interconnections; Multichip modules; Performance evaluation; Printed circuits; Programmable logic arrays; Silicon; System testing;

English

ieee

Multichip Modules, 1994. Proceedings of the 1994 International Conference on

0-930815-39-4

conf

10.1109/ICMCM.1994.753554

753554