Title :
Universal Membrane Probe for Known Good Die
Author :
Kondoh, You ; Ueno, Toshiaki
Author_Institution :
Hewlett-Packard Laboratories, Japan
Keywords :
Biomembranes; Contacts; Costs; Manufacturing; Needles; Passivation; Probes; Testing; Wafer bonding; Wiring;
Conference_Titel :
Multichip Modules, 1994. Proceedings of the 1994 International Conference on
Print_ISBN :
0-930815-39-4
DOI :
10.1109/ICMCM.1994.753558
