Title :
Effect Of Interface On Coupling Of NiFeCo/TaN/NiFeCo Sandwich Films
Author :
Yeh, T. ; Berg, L. ; Swanson, D. ; Karn, P.
Author_Institution :
Solid State Electronics Center, Honeywell Inc.
Keywords :
Coercive force; Couplings; Magnetic domain walls; Magnetic films; Magnetic properties; Magnetic separation; Magnetization reversal; Nonvolatile memory; Road transportation; Solid state circuits;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597766