Title :
Bridging the gap between design and testing of analog integrated circuits
Author :
Soenen, E. ; VanPeteghem, P. ; Liu, H. ; Narayan, S. ; Cummings, J.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
A global methodology for the design of analog and mixed analog/digital integrated systems is outlined. The methodology calls for a flexible framework that combines CAD software, simulators, measurement set-ups, and data-processing software. As an application example within such a framework, error modeling and estimation in multistage analog/digital converters is discussed using a new algorithm
Keywords :
analogue-digital conversion; application specific integrated circuits; circuit CAD; integrated circuit testing; linear integrated circuits; CAD software; analog IC design; analog IC testing; application example; bridging gap between design and test; data-processing software; error modeling and estimation; fault analysis; flexible framework; global methodology; measurement set-ups; mixed analog/digital integrated systems; mixed mode IC design; multistage analog/digital converters; simulators; Analog integrated circuits; Analog-digital conversion; Circuit simulation; Circuit testing; Data processing; Driver circuits; Instruments; Integrated circuit testing; Iterative algorithms; Signal processing algorithms;
Conference_Titel :
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location :
New Orleans, LA
DOI :
10.1109/ISCAS.1990.112570
