Constant testability for single fault detection in two-dimensional systolic array structures for matrix multiplication

The authors show that two-dimensional arrays (which are used for matrix multiplication) can be tested with a test set whose cardinality is independent of the array size (C-testability). The proposed approach is based on the computational characteristics of a basic cell in a systolic array. The inner product step is analyzed for three basic configurations of two-dimensional arrays. The approach utilizes a cell-level functional characterization which relates observability and controllability to the processing of each cell. Orthogonal, bilateral, and hexagonal arrays are discussed