Title :
Global Optimization of MCMs with ASICs Using Concurrent Engineering
Author :
CAZENAVE, Jean-Pierre ; Dupenloup, G.
Author_Institution :
Dassault Electronique, France
Keywords :
Aluminum; Application specific integrated circuits; CMOS technology; Concurrent engineering; Design for testability; Energy consumption; Packaging machines; Signal design; Space technology; Testing;
Conference_Titel :
Multichip Modules, 1994. Proceedings of the 1994 International Conference on
Print_ISBN :
0-930815-39-4
DOI :
10.1109/ICMCM.1994.753581