Title :
Environmental Performance of Sealed Chip-On-Board (scob) Memory Circuits
Author :
Gates, Louis E. ; Steckler, Beth E.
Author_Institution :
Hughes Aircraft Company, Radar Systems, CA
Keywords :
Aircraft; Assembly; Circuit testing; Coatings; Electronics packaging; Optical fiber testing; Passivation; Protection; SRAM chips; US Department of Energy;
Conference_Titel :
Multichip Modules, 1994. Proceedings of the 1994 International Conference on
Print_ISBN :
0-930815-39-4
DOI :
10.1109/ICMCM.1994.753587