Title :
Yield enhancement for WSI array processors using two-and-half-track switches
Author :
Jean, J.S.N. ; Fu, H.C. ; Kung, S.Y.
Author_Institution :
Dept. of Comput. Sci. & Eng., Wright State Univ., Dayton, OH, USA
Abstract :
Addresses the enhancement of fabrication yield for arrays of large number of processors. An array grid model based on two-and-half-track switches is adopted. It is shown that two-and-half-track switches, possessing much better reconfigurability capability than that of one-and-half-track switches, are more suitable for yield enhancement. Moreover, the authors are able to develop a reconfiguration algorithm based on the one-and-half-track reconfiguration algorithm. The algorithm can effectively deal with faults on the switches, wires, and connections
Keywords :
VLSI; cellular arrays; fault tolerant computing; integrated circuit technology; microprocessor chips; redundancy; semiconductor switches; WSI array processors; array grid model; arrays of large number of processors; enhancement of fabrication yield; reconfigurability capability; two-and-half-track switches; yield enhancement; Communication switching; Communication system control; Fabrication; Image processing; Manufacturing; Routing; Signal processing; Silicon; Switches; Wires;
Conference_Titel :
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9013-5
DOI :
10.1109/ICWSI.1990.63907