Title :
Optimal Test Set Selection for Fault Diagnosis Improvement
Author :
Amati, L. ; Bolchini, C. ; Salice, F.
Author_Institution :
Dip. Elettron. e Inf., Politec. di Milano, Milan, Italy
Abstract :
This paper proposes an approach for improving the diagnostic capability of a test-set used in the initial phases of the diagnosis process, when the system is quickly tested with a set of vectors aimed at making the fault observable with the smallest number of vectors. The selection policy identifies the optimal test set with respect to both minimal cardinality and maximum coverage, exploiting an ILP problem formulation. Approach and rationale are supported by analytical methods and criteria, and validated by a set of experimental results.
Keywords :
automatic test pattern generation; fault diagnosis; integer programming; linear programming; vectors; ATPG tool; ILP problem formulation; analytical methods; fault diagnosis improvement; integer linear programming; optimal test set selection; Circuit faults; Fault diagnosis; Logic gates; Numerical models; Optimization; Probabilistic logic; Vectors; Fault Diagnosis; Integer Linear Programming.; Test-sets minimization;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
DOI :
10.1109/DFT.2011.57