• DocumentCode
    2663969
  • Title

    Optimal Test Set Selection for Fault Diagnosis Improvement

  • Author

    Amati, L. ; Bolchini, C. ; Salice, F.

  • Author_Institution
    Dip. Elettron. e Inf., Politec. di Milano, Milan, Italy
  • fYear
    2011
  • fDate
    3-5 Oct. 2011
  • Firstpage
    93
  • Lastpage
    99
  • Abstract
    This paper proposes an approach for improving the diagnostic capability of a test-set used in the initial phases of the diagnosis process, when the system is quickly tested with a set of vectors aimed at making the fault observable with the smallest number of vectors. The selection policy identifies the optimal test set with respect to both minimal cardinality and maximum coverage, exploiting an ILP problem formulation. Approach and rationale are supported by analytical methods and criteria, and validated by a set of experimental results.
  • Keywords
    automatic test pattern generation; fault diagnosis; integer programming; linear programming; vectors; ATPG tool; ILP problem formulation; analytical methods; fault diagnosis improvement; integer linear programming; optimal test set selection; Circuit faults; Fault diagnosis; Logic gates; Numerical models; Optimization; Probabilistic logic; Vectors; Fault Diagnosis; Integer Linear Programming.; Test-sets minimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4577-1713-0
  • Type

    conf

  • DOI
    10.1109/DFT.2011.57
  • Filename
    6104432