• DocumentCode
    2663980
  • Title

    Impact of Synthesis Constraints on Error Propagation Probability of Digital Circuits

  • Author

    Limbrick, Daniel B. ; Yue, Suge ; Robinson, William H. ; Bhuva, Bharat L.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
  • fYear
    2011
  • fDate
    3-5 Oct. 2011
  • Firstpage
    103
  • Lastpage
    111
  • Abstract
    Optimization algorithms for the synthesis of digital logic circuits have been used to automate the process of meeting design constraints like area and timing. These algorithms affect a circuit´s topology and therefore its vulnerability to soft errors. This paper investigates the impact that these optimizations have on the error propagation probability of various circuit benchmarks. Results indicate that a decrease in delay and area corresponds with an increase in error propagation probability. Additionally, an increase in mapping effort corresponds to an increase in error propagation probability.
  • Keywords
    logic testing; optimisation; probability; radiation hardening (electronics); circuit benchmarks; circuit topology; design constraints; digital logic circuits; error propagation probability; optimization algorithms; soft errors; synthesis constraints; Benchmark testing; Delay; Equations; Libraries; Logic gates; Mathematical model; Optimization; combinational logic; constraint optimization; error propagation probability; logic synthesis; logical masking; soft error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4577-1713-0
  • Type

    conf

  • DOI
    10.1109/DFT.2011.46
  • Filename
    6104433