Title :
Impact of Synthesis Constraints on Error Propagation Probability of Digital Circuits
Author :
Limbrick, Daniel B. ; Yue, Suge ; Robinson, William H. ; Bhuva, Bharat L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
Optimization algorithms for the synthesis of digital logic circuits have been used to automate the process of meeting design constraints like area and timing. These algorithms affect a circuit´s topology and therefore its vulnerability to soft errors. This paper investigates the impact that these optimizations have on the error propagation probability of various circuit benchmarks. Results indicate that a decrease in delay and area corresponds with an increase in error propagation probability. Additionally, an increase in mapping effort corresponds to an increase in error propagation probability.
Keywords :
logic testing; optimisation; probability; radiation hardening (electronics); circuit benchmarks; circuit topology; design constraints; digital logic circuits; error propagation probability; optimization algorithms; soft errors; synthesis constraints; Benchmark testing; Delay; Equations; Libraries; Logic gates; Mathematical model; Optimization; combinational logic; constraint optimization; error propagation probability; logic synthesis; logical masking; soft error;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
DOI :
10.1109/DFT.2011.46