DocumentCode
2663980
Title
Impact of Synthesis Constraints on Error Propagation Probability of Digital Circuits
Author
Limbrick, Daniel B. ; Yue, Suge ; Robinson, William H. ; Bhuva, Bharat L.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
fYear
2011
fDate
3-5 Oct. 2011
Firstpage
103
Lastpage
111
Abstract
Optimization algorithms for the synthesis of digital logic circuits have been used to automate the process of meeting design constraints like area and timing. These algorithms affect a circuit´s topology and therefore its vulnerability to soft errors. This paper investigates the impact that these optimizations have on the error propagation probability of various circuit benchmarks. Results indicate that a decrease in delay and area corresponds with an increase in error propagation probability. Additionally, an increase in mapping effort corresponds to an increase in error propagation probability.
Keywords
logic testing; optimisation; probability; radiation hardening (electronics); circuit benchmarks; circuit topology; design constraints; digital logic circuits; error propagation probability; optimization algorithms; soft errors; synthesis constraints; Benchmark testing; Delay; Equations; Libraries; Logic gates; Mathematical model; Optimization; combinational logic; constraint optimization; error propagation probability; logic synthesis; logical masking; soft error;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location
Vancouver, BC
Print_ISBN
978-1-4577-1713-0
Type
conf
DOI
10.1109/DFT.2011.46
Filename
6104433
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