DocumentCode :
2664066
Title :
Templated-Based Asynchronous Design for Testable and Fail-Safe Operation
Author :
Zamani, M. ; Pedram, H. ; Lombardi, F.
Author_Institution :
Dept. of ECE, Northeastern Univ., Boston, MA, USA
fYear :
2011
fDate :
3-5 Oct. 2011
Firstpage :
146
Lastpage :
152
Abstract :
Asynchronous design is a promising alternative for emerging technologies facing extreme parameter variation, severe timing/clock skew and power consumption issues. However, the complexity in design and test is one of the major obstacles for the widespread use of asynchronous circuits in digital design. Circuits utilizing templates are often implemented to mitigate the design complexity of an asynchronous circuit. One of the most commonly used pre-designed templates is the so-called Pre-Charged Full Buffer (PCFB), however, when testing template-based designs, most of the faults are undetectable by using conventional methods. In this paper, the PCFB template is designed such that faults always result in three scenarios (deadlock, token generation and dropping) for ease of detection, its operation and the new design of the hardware required for testability are described in detail. It is analytically shown that under a model that includes all single stuck-at faults, the new template (as characterized by novel features in its design) accomplishes ease of testability as well as online detection and fail-safe circuit operation. 100% coverage of single faults is accomplished. Simulation results for benchmark circuits are provided.
Keywords :
asynchronous circuits; buffer circuits; logic design; logic testing; PCFB template; asynchronous circuit; digital design; fail-safe circuit operation; fail-safe operation; online detection; power consumption; precharged full buffer; template-based designs; templated-based asynchronous design; testable operation; timing-clock skew; Asynchronous circuits; Circuit faults; Delay; Logic gates; System recovery; Wires; PCFB; Testable design; asyncronous design; fail-safe; template;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
Type :
conf
DOI :
10.1109/DFT.2011.63
Filename :
6104438
Link To Document :
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