Modeling Yield of Self-Healing Carbon Nanotubes/Silicon-Nanowire FET-based Nanoarray

This paper presents a study on the yield of a carbon-nanotube/nanowire-based nanoarray with a focus on a novel property, namely, the self-healing capability, and its impact on the yield improvement. Chemical and fabrication process of nanotube/nanowires for the self-healing capability has been exercised along with the utilization of redundancy. However, no work has adequately addressed the yield issues with synergistic effect of the defect/failure-tolerance by redundancy and self-healing taken into proper account. Also, this work effectively and efficiently addresses the architectural impact on the yield along with the yield improvement processes. Based on the proposed yield model, a set of parametric simulation results is presented to demonstrate the synergistic impact of the conventional redundancy-based defect/failure-tolerance and the self-healing capability on the yield in the context of the unique architecture of the carbon-nanotube/nanowire-based nanoarray.