DocumentCode :
2664201
Title :
Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid
Author :
Jain, Vijay K. ; Chapman, Glenn H.
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
fYear :
2011
fDate :
3-5 Oct. 2011
Firstpage :
235
Lastpage :
242
Abstract :
We have recently proposed 3-D intelligent sensors for the power grid with a view toward helping improve its reliability and restoration capability. Our solution is to use a matrix of fault tolerant distributed sensors that can sense as well as take local actions. These new sensors are "3-D Heterogeneous Sensor System on a Chip (HSoC)", which can potentially overcome delays and domino effects. The paper specifically focuses on the application of the 3-D HSoCs for fault-distance estimation and the issues involved in the failure of such devices - due to defects both within the chip and due to external stress. We show that the use of multiple devices brings benefits relating to both the detection and accuracies of fault distance and arc voltage estimates. Specifically, if the nearest device is located at -x relative to the location of the transmission line fault, then the use of additional devices at -D-x, D-x, and 2D-x diminishes the probability of loss of detection considerably. The paper presents studies on this fault tolerance, as well as accuracy of estimation, vs. the number of devices used for collaborative detection. It is important to note that this collaboration does not require additional sensors, only communication among them. Matrixed HSoCs can provide several fold improvement over single HSoC.
Keywords :
intelligent sensors; power transmission faults; power transmission lines; smart power grids; 3D heterogeneous sensor system on a chip; 3D intelligent sensors; fault tolerant distributed sensors; fault-distance estimation; smart power grid; transmission line fault; Estimation; Fault tolerance; Fault tolerant systems; Intelligent sensors; Power transmission lines; Sensor systems; 3-D HSoC sensors; Smart power grid; defect and fault tolerance; matrixed deployment; power grid fault detection and distance estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
Type :
conf
DOI :
10.1109/DFT.2011.40
Filename :
6104448
Link To Document :
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