• DocumentCode
    2664301
  • Title

    Integrating Large Wind Farms into Weak Power Grids with Long Transmission Lines

  • Author

    Piwko, Richard ; Miller, Nicholas ; Sanchez-Gasca, Juan ; Yuan, Xiaoming ; Dai, Renchang ; Lyons, James

  • Author_Institution
    GE Energy, Schenectady, NY
  • Volume
    2
  • fYear
    2006
  • fDate
    14-16 Aug. 2006
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper addresses some of the most significant challenges for wind generation facilities, including voltage control, reactive power management, dynamic power-swing stability, and behavior following disturbances in the power grid. This advanced hierarchical control of both real and reactive power output can provide dynamic performance that is, superior to that achievable with modern conventional synchronous generation. This paper describes wind farm control functions, including performance for controlling grid voltage in quasi-steady-state and dynamic conditions. Low-voltage ride-through characteristics, including performance following severe system disturbances. Dynamic power control functions within wind turbine-generators, including transient and dynamic performance for power swings
  • Keywords
    power generation control; power generation faults; power grids; power system dynamic stability; power transmission lines; reactive power control; voltage control; wind power plants; wind turbines; dynamic power-swing stability; long transmission lines; power grid disturbance; reactive power control; reactive power management; voltage control; wind farms; wind turbine-generators; Power generation; Power grids; Power system dynamics; Power system stability; Power transmission lines; Reactive power control; Voltage control; Wind energy generation; Wind farms; Wind power generation; LVRT; Low Voltage Ride Through; Power Swings; Voltage Regulation; Wind Farm Integration; Wind Generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Motion Control Conference, 2006. IPEMC 2006. CES/IEEE 5th International
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0448-7
  • Type

    conf

  • DOI
    10.1109/IPEMC.2006.4778165
  • Filename
    4778165