A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies

Author

Bastos, Rodrigo P. ; Natale, Giorgio Di ; Flottes, Marie-Lise ; Rouzeyre, Bruno

Author_Institution

LIRMM, Univ. Montpellier II, Montpellier, France

fYear

2011

fDate

3-5 Oct. 2011

Firstpage

302

Lastpage

308

Abstract

Today´s deeply-scaled technology-based integrated circuits are highly sensitive to soft error, tending to be even more in the future. In fact, emerging critical issues are related to transient faults that now can be as long as circuits´ clock periods. This work presents a novel improved strategy based on bulk built-in current sensors that is able to cope with long-duration transient faults. Our cost-effective approach is a concurrent error detection scheme with recovery procedure, and rather than existing similar strategy, it has faster correction latency and uses less recovery resources.

Keywords

error detection; fault diagnosis; integrated circuits; sensors; bulk built-in current sensor-based strategy; circuit clock periods; deep-submicron technology; integrated circuits; long-duration transient faults; Circuit faults; Clocks; Delay; Detectors; Redundancy; Registers; Transient analysis; concurrent error detection schemes; fault attacks; long-duration transient faults; soft errors;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on

Conference_Location

Vancouver, BC

Print_ISBN

978-1-4577-1713-0

Type

conf

DOI

10.1109/DFT.2011.15

Filename

6104456