• DocumentCode
    2664394
  • Title

    Reliable Hardware Architectures for the Third-Round SHA-3 Finalist Grostl Benchmarked on FPGA Platform

  • Author

    Mozaffari-Kermani, Mehran ; Reyhani-Masoleh, Arash

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, ON, Canada
  • fYear
    2011
  • fDate
    3-5 Oct. 2011
  • Firstpage
    325
  • Lastpage
    331
  • Abstract
    The third round of competition for the SHA-3 candidates is ongoing to select the winning function in 2012. Although much attention has been devoted to the performance and security of these candidates, the approaches for increasing their reliability have not been presented to date. In this paper, for the first time, we propose a high-performance scheme for fault detection of the SHA-3 round-three candidate Grostl which is inspired by the Advanced Encryption Standard (AES). We propose a low-overhead fault detection scheme by presenting closed formulations for the predicted signatures of different transformations of this SHA-3 third-round finalist. These signatures are derived to achieve low overhead and include one or multi-bit parities and byte/word-wide predicted signatures. The proposed reliable hardware architectures for Grostl are implemented on Xilinx Virtex-6 FPGA family to benchmark their hardware and timing characteristics. The results of our evaluations show high error coverage and acceptable overhead for the proposed scheme.
  • Keywords
    cryptography; fault diagnosis; field programmable gate arrays; integrated circuit reliability; AES; Xilinx Virtex-6 FPGA platform family; advanced encryption standard; byte-word-wide predicted signature; hardware architecture reliability; low-overhead fault detection scheme; multibit parity predicted signature; third-round SHA-3 finalist Grostl benchmark; Benchmark testing; Delay; Encryption; Fault detection; Field programmable gate arrays; Hardware; Reliability; FPGA platform; Fault detection scheme; Grøstl; SHA-3; reliable hardware implementation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4577-1713-0
  • Type

    conf

  • DOI
    10.1109/DFT.2011.60
  • Filename
    6104459