DocumentCode :
2664684
Title :
A linear digital VCO for Clock Data Recovery (CDR) applications
Author :
Helinski, Ryan ; LeBoeuf, Thomas ; Hoffman, Colby ; Zarkesh-Ha, Payman
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
fYear :
2010
fDate :
12-15 Dec. 2010
Firstpage :
98
Lastpage :
101
Abstract :
A new digital Voltage Controlled Oscillator (VCO) with the capability of fine tuning as well as coarse tuning controls is presented in this paper. Unlike conventional inverter-chain-based VCOs, the new design has more linear dependency of output frequency to input control voltage. The new VCO is a good candidate for modern Clock and Data Recovery (CDR) circuits because of this dual control. As a proof of concept, the functionality of the new VCO is verified in a CDR circuit used in a monolithic Serializer and Deserializer (SerDes) test chip fabricated in 0.5um ON Semiconductor process. The SerDes test chip was successfully tested at an operating frequency of 90MHz with a lock range of about 4.6 MHz due to the fine-tuning of the VCO. It is expected that using a more advanced process technology, a higher operating frequency can be easily achieved.
Keywords :
clock and data recovery circuits; integrated circuit testing; invertors; voltage-controlled oscillators; clock and data recovery circuit; coarse tuning control; fine tuning capability; frequency 90 MHz; inverter-chain-based VCO; linear digital voltage controlled oscillator; monolithic serializer and deserializer test chip; semiconductor process; voltage control; Clocks; Integrated circuits; Phase measurement; Semiconductor device measurement; Size measurement; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-8155-2
Type :
conf
DOI :
10.1109/ICECS.2010.5724463
Filename :
5724463
Link To Document :
بازگشت