Title :
Design of a 7-bit 1GSPS folding-interpolation A/D converter with self-calibration technique
Author :
Kim, Younghoon ; Jeon, Jungwon ; Cho, Kyuik ; Kim, Daeyun ; Moon, Joonho ; Song, Minkyu
Author_Institution :
Dept. of Semicond. Sci., Dongguk Univ-Seoul, Seoul, South Korea
Abstract :
In this paper, a 65nm 1.2V 7-bit 1GSPS A/D converter with a self-calibration technique is proposed. The A/D converter is based on a folding-interpolation structure whose folding rate is 2, interpolation rate is 8. An offset self-calibration circuit with a feedback loop and a recursive digital code inspection is described. The offset self-calibration circuit reduces the variation of the offset voltage, due to process mismatches, parasitic resistors, and parasitic capacitances. The chip has been fabricated with a 65nm 1-poly 6-metal CMOS technology. The effective chip area is 0.87mm2 and the power consumption is about 110mW with a 1.2V power supply. The measured SNDR is about 38.48dB when the input frequency is 250MHz at 1GHz sampling frequency. The measured SNDR is 3dB higher than the same ADC without any calibration.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; calibration; interpolation; CMOS technology; feedback loop; folding-interpolation A-D converter; frequency 1 GHz; frequency 250 MHz; offset self-calibration circuit; offset voltage variation; parasitic capacitances; parasitic resistors; recursive digital code inspection; self-calibration technique; size 65 nm; voltage 1.2 V; Calibration; Clocks; Degradation; 7bit; ADC; Folding; Interpolation; Self-Calibration;
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-8155-2
DOI :
10.1109/ICECS.2010.5724466