• DocumentCode
    2664763
  • Title

    Author Index

  • fYear
    2011
  • fDate
    3-5 Oct. 2011
  • Firstpage
    481
  • Lastpage
    482
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4577-1713-0
  • Type

    conf

  • DOI
    10.1109/DFT.2011.65
  • Filename
    6104477
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2664763