DocumentCode :
2664818
Title :
Exploring the Use of Local Binary Patterns as Focus Measure
Author :
Lorenzo, J. ; Castrillón, M. ; Méndez, J. ; Déniz, O.
Author_Institution :
Inst. of Intell. Syst. (SIANI), Univ. de Las Palmas de Gran Canaria, Las Palmas, Spain
fYear :
2008
fDate :
10-12 Dec. 2008
Firstpage :
855
Lastpage :
860
Abstract :
In this work local binary patterns based focus measures are presented. Local binary patterns (LBP) have been introduced in computer vision tasks like texture classification or face recognition. In applications where recognition is based on LBP, a computational saving can be achieved with the use of LBP in the focus measures. The behavior of the proposed measures is studied to test if they fulfill the properties of the focus measures and then a comparison with some well know focus measures is carried out in different scenarios.
Keywords :
computer vision; computer vision tasks; face recognition; focus measure; local binary patterns; texture classification; Application software; Computer vision; Digital cameras; Face detection; Face recognition; Focusing; Frequency; Iris; Lenses; Testing; Autofocus; Local Binary Patterns;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence for Modelling Control & Automation, 2008 International Conference on
Conference_Location :
Vienna
Print_ISBN :
978-0-7695-3514-2
Type :
conf
DOI :
10.1109/CIMCA.2008.123
Filename :
5172737
Link To Document :
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