• DocumentCode
    2664942
  • Title

    Analysis of Abnormal Phenomenon in Common-Source-type Forward Converter with Self-driven Synchronous Rectifier

  • Author

    Fukushima, Kentaro ; Hashimoto, Takayoshi ; Ninomiya, Tamotsu ; Segawa, Takeshi

  • Author_Institution
    Kyushu Univ., Fukuoka
  • Volume
    2
  • fYear
    2006
  • fDate
    14-16 Aug. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Many DC-DC converters use soft-switching techniques with active-clamp snubber in order to reduce switching surge and common-mode noise. In particular, common-source type active-clamped DC-DC converter is one of the most useful circuit topology for reduction of common-mode noise. Furthermore, in low-voltage and large-current DC-DC converters, synchronous rectifier circuits are used to improve the power efficiency. Self-driven synchronous rectifier circuits are generally used because of isolation and easy control. Recently, it has been noticed that an abnormal phenomenon occurs under some conditions in the common-source type forward converter with self-driven synchronous rectifier circuit. This paper describes the analysis of this abnormal phenomenon and clarifies the conditions of the abnormal phenomenon with experimental results
  • Keywords
    DC-DC power convertors; network topology; rectifiers; snubbers; switching convertors; DC-DC converters; abnormal phenomenon analysis; active-clamp snubber; circuit topology; common-mode noise; common-source-type forward converter; power efficiency; self-driven synchronous rectifier; soft-switching techniques; switching surge; Circuit noise; Circuit topology; DC-DC power converters; Equivalent circuits; MOSFET circuits; Noise reduction; Rectifiers; Switching converters; Virtual colonoscopy; Voltage; abnormal phenomenon; common-source-type active-clamped; synchronous rectifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Motion Control Conference, 2006. IPEMC 2006. CES/IEEE 5th International
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0448-7
  • Type

    conf

  • DOI
    10.1109/IPEMC.2006.4778206
  • Filename
    4778206