Abstract :
The following topics are dealt with: soft error analysis; error detection; error correction; nanoscale circuits; reliability; fault tolerant design; delay fault testing; nanotechnology systems; fault diagnosis and Network on Chip.
Keywords :
error correction; error detection; fault diagnosis; fault tolerance; integrated circuit reliability; nanotechnology; network-on-chip; radiation hardening (electronics); delay fault testing; error correction; error detection; fault diagnosis; fault tolerant design; nanoscale circuit; network on chip; reliability; soft error analysis;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
DOI :
10.1109/DFT.2011.68
