• DocumentCode
    2665244
  • Title

    A digital IC Random Number Generator with logic gates only

  • Author

    Guler, Ülkühan ; Ergün, Salih ; Dündar, Günhan

  • Author_Institution
    UEKAE, Kocaeli, Turkey
  • fYear
    2010
  • fDate
    12-15 Dec. 2010
  • Firstpage
    239
  • Lastpage
    242
  • Abstract
    Random Number Generators with logic gates only are popular among digital IC designers in terms of their speed compatibility and uncomplicated integration to digital platforms. To the best of our knowledge, this paper presents the first ASIC implementation of a Random Number Generator based on Fibonacci and Galois ring oscillators. Prototypes have been designed and fabricated by using HHNEC´s 0.25μm eFlash process with a supply voltage of 2.5V. Fibonacci and Galois ring oscillators are implemented in combined configuration. A combined configuration, which consists of a Fibonacci ring oscillator with 16 inverters and a Galois ring oscillator with 32 inverters, occupies 0.0048mm2 and dissipates 2.5mW of power which is quite small compared to other well-known random number generators based on digital circuitry. IC design level experiences, measurements, analysis of measurements and statistical test results are also demonstrated. Furthermore, we propose to use several of these oscillators in an xored configuration, in order to speed up and improve the quality of the generated bit stream. We could achieve fulfilled test results from NIST 800-22 test suit after Von Neumann corrector for 7 xored Fibonacci and Galois ring oscillators with a sampling frequency of 125MHz and 31.25Mbps throughput. In addition, increasing the number of xored Fibonacci and Galois ring oscillators from 7 to 8 also fulfills the tests of NIST 800-22 at the same sampling frequency however, without any further post processing. Thus, 125Mbps of throughput, which is the highest data rate to date with fulfilled test results, could be obtained.
  • Keywords
    application specific integrated circuits; integrated circuit design; integrated logic circuits; invertors; logic gates; oscillators; random number generation; ASIC; Fibonacci ring oscillator; Galois ring oscillator; Von Neumann corrector; bit rate 125 Mbit/s; bit rate 31.25 Mbit/s; digital IC random number generator; eflash process; frequency 125 MHz; inverter; logic gates; power 2.5 mW; power dissipation; size 0.25 mum; voltage 2.5 V; Cryptography; Radio access networks; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4244-8155-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2010.5724498
  • Filename
    5724498