DocumentCode :
2665352
Title :
Software for processing metrological certification results of short impulse gauges
Author :
Skoblikov, O.Y.
Author_Institution :
Res. & Design Inst. Molniya, Nat. Tech. Univ., Kharkiv, Ukraine
fYear :
2010
fDate :
6-10 Sept. 2010
Firstpage :
256
Lastpage :
258
Abstract :
“Etalon-PEMF” and “Etalon-TN” are used for metrological certification of gauges for fast processes, pulse electromagnetic fields, currents and voltages in particular. The current metrological standard GOST 8.207-2008 presupposes quite a big amount of routine calculations for the gauge certification, which makes the process very labor-intensive and increases error probability. The specialized software “Metrological statistics”, developed by the author, enables to solve this problem, extracting the data from oscilloscope images, processing all the necessary calculations and creating certification reports.
Keywords :
certification; electromagnetic fields; error statistics; gauges; interferometers; signal processing; software process improvement; error probability; metrological certification results; metrological statistics; short impulse gauges; Certification; Current measurement; Graphics; Magnetic fields; Oscilloscopes; Software; Ultra wideband technology; Electromagnetic fields; data processing; gauges; metrological certification; specialized software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), 2010 5th International Conference on
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-7470-7
Electronic_ISBN :
978-1-4244-7469-1
Type :
conf
DOI :
10.1109/UWBUSIS.2010.5609122
Filename :
5609122
Link To Document :
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