Title :
Integrated computer-assisted process management
Author :
Raulefs, Peter ; Bhatt, Rahul ; Culley, Robert ; Guyon, William ; Hakim, Nagib ; Kumar, Gannaparthy ; Scott, Gary ; Sikka, Digvijay
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
Managing a manufacturing process involves monitoring, diagnosis, and control. An architecture that merges existing data collection and analysis systems with AI-based pattern-detection, interpretation, and decision-making facilities is described. Functions are performed by agents that distribute tasks and control in a way that can be closely tailored to the manufacturing environment. Technical principles and the development strategy are discussed, together with experiences on already operating components
Keywords :
artificial intelligence; computer integrated manufacturing; electronics industry; intelligent design assistants; model-based reasoning; process control; production engineering computing; AI-based pattern-detection; architectural framework; causal models; computer support tools; control; cooperating agents; decision-making; development strategy; diagnosis; engineering models; integrated computer-assisted process management; monitoring; process flow models; process monitoring agent; semiconductor industry; wafer models; Computerized monitoring; Data analysis; Decision making; Educational institutions; Knowledge management; Manufacturing processes; Pattern analysis; Production facilities; Semiconductor device manufacture; Technology management;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1993, Fifteenth IEEE/CHMT International
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-1424-7
DOI :
10.1109/IEMT.1993.398184
