DocumentCode :
2665654
Title :
Lateral Field Excitation of membrane-based Aluminum Nitride resonators
Author :
Gorisse, M. ; Reinhardt, A. ; Billard, C. ; Borel, M. ; Defaÿ, E. ; Bertaud, T. ; Lacrevaz, T. ; Bermond, C.
Author_Institution :
Leti, CEA, Grenoble, France
fYear :
2011
fDate :
2-5 May 2011
Firstpage :
1
Lastpage :
5
Abstract :
This paper reports the fabrication of Lateral Field Excitation resonators on a free-standing Aluminum Nitride membrane. We present a very simple fabrication process, and discuss the electrical measurements. In particular, the influence of the electrode width on the generation of parasitic longitudinal waves is demonstrated. We also provide measurements of the temperature dependence of the resonance frequency of the thickness-shear mode, which is of -14 ppm/°C, being much lower than the temperature dependence of the thickness-extensional mode in the same material stack.
Keywords :
III-V semiconductors; aluminium compounds; bulk acoustic wave devices; membranes; resonators; temperature measurement; wide band gap semiconductors; AlN; electrical measurements; electrode; fabrication process; lateral field excitation resonators; membrane-based aluminum nitride resonators; temperature dependence measurements; thickness-extensional mode; thickness-shear mode; Acoustics; Electric fields; Electrodes; Films; Frequency measurement; Resonant frequency; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location :
San Fransisco, CA
ISSN :
1075-6787
Print_ISBN :
978-1-61284-111-3
Type :
conf
DOI :
10.1109/FCS.2011.5977794
Filename :
5977794
Link To Document :
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