Title :
The study of activation energy(Ea) by aging and high temperature storage for quartz resonators´ life evaluation
Author :
Shen, Chun-Nan ; Chao, Min-Chiang ; Yang, Xiao-Wei ; Chang, Colin
Author_Institution :
TXC(NINGBO) Corp., Ningbo, China
Abstract :
This paper studied the evaluation of activation energy(Ea) based on the experimental data from quartz resonators´ biased aging and high temperature storage. 5.0 mm × 3.2 mm metal seam sealed quartz resonators were used in this study. To assure the results are trustable, two approach methods were used for Ea evaluation. The first method is data fit by Arrhenius model for biased aging data. The second method is MTBF evaluation based on high temperature storage data. Both methods conclude the close Ea value, about 0.578eV, and which means 85°C for 7 days accelerated aging is equivalent as 0.83 year at 25°C.
Keywords :
ageing; crystal resonators; high-temperature effects; life cycle costing; seals (stoppers); Arrhenius model; MTBF evaluation; activation energy evaluation; biased aging data; high temperature storage; metal seam sealed quartz resonator; quartz resonator life evaluation; Acceleration; Aging; Equations; Mathematical model; Reliability; Temperature distribution;
Conference_Titel :
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location :
San Fransisco, CA
Print_ISBN :
978-1-61284-111-3
DOI :
10.1109/FCS.2011.5977804