Title :
Use of AOM-RN as a phase modulator in FM sideband heterodyne technique in the atomic frequency standards
Author :
Baryshev, Viacheslav ; Epikhin, Viacheslav ; Slyusarev, Sergey
Author_Institution :
FGUP VNIIFTRI, Mendeleevo, Russia
Abstract :
AOM-RN, an acousto-optic modulator designed to operate in the pure Raman-Nath diffraction regime, was applied as an optical phase modulator in FM spectroscopy of saturated absorption resonances, coherent population trapping resonances, sub-natural magneto-optical resonances in Cs vapor, i.e. such kind of optical resonances which are currently employed as the frequency references in metrology of the microwave and optical frequency standards and in magnetometry. We show experimentally that the spatial divergence of the AOM-RN frequency modulated output spectrum, the only seeming disadvantage of AOM-RN, is not an obstacle, as well, to obtain the error signals by means of Pound-Drever-Hall heterodyne technique with the use of high-finesse (up to tens of thousands) Fabry-Perot cavities as the frequency discriminators.
Keywords :
acousto-optical effects; acousto-optical modulation; frequency modulation; frequency standards; light diffraction; magneto-optical modulation; magnetometers; optical modulation; phase modulation; AOM-RN frequency modulated output spectrum; FM sideband heterodyne technique; FM spectroscopy; Fabry-Perot cavity; Pound-Drever-Hall heterodyne technique; Raman-Nath diffraction regime; absorption resonance; acousto-optic modulator; atomic frequency standard; coherent population trapping resonance; error signal; frequency discriminator; magnetometry; microwave frequency standard; optical frequency standard; optical phase modulator; spatial divergence; subnatural magneto-optical resonance; technique; Adaptive optics; Frequency modulation; Optical diffraction; Optical saturation; Phase modulation; Resonant frequency; Spectroscopy;
Conference_Titel :
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location :
San Fransisco, CA
Print_ISBN :
978-1-61284-111-3
DOI :
10.1109/FCS.2011.5977806