DocumentCode :
2666013
Title :
Design and Test of Novel Programmable Digital Three Phases SPWM Chip
Author :
Yuan, Yang ; Yong, Gao ; Lijie, Chen
Author_Institution :
Dept. of Electron. Eng., Xi´´an Univ. of Technol.
Volume :
3
fYear :
2006
fDate :
14-16 Aug. 2006
Firstpage :
1
Lastpage :
3
Abstract :
In order to improve the sinusoidal pulse width modulation (SPWM) control system\´s real time capability and reduce the system\´s complexity, a high precision programmable digital three phases SPWM chip based on variable sampling frequency method is designed. The chip can be "programmed" by MCU to set the needed parameters with great flexibility and can be interfaced with multiplexed and non-multiplexed data bus mode. To implement the high precision for any frequency sinusoidal power wave, an improved method is presented by changing the sampling clock frequency for different power frequency while keeping the sampling points constant. In addition, the pipeline structure also has improved the speed of the system. The chip is fabricated with 0.35 mum CMOS technology and the core area is 1755times1746 mum2. The test results show that the chip has reached its specifications. The control resolution for any power frequency is up to 16 bits, the system clock can reach 50 MHz, and the ROM operation period is up to 1.68 mus
Keywords :
CMOS integrated circuits; microcontrollers; pipeline processing; read-only storage; 0.35 micron; 1.68 mus; 50 MHz; CMOS technology; MCU; ROM; control resolution; control system; pipeline structure; power frequency; programmable digital three phase SPWM chip; sampling clock frequency; sinusoidal pulse width modulation; variable sampling frequency method; CMOS technology; Clocks; Control systems; Digital modulation; Frequency; Phase modulation; Pulse width modulation; Sampling methods; Space vector pulse width modulation; Testing; SPWM; chip; design; test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Motion Control Conference, 2006. IPEMC 2006. CES/IEEE 5th International
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0448-7
Type :
conf
DOI :
10.1109/IPEMC.2006.4778268
Filename :
4778268
Link To Document :
بازگشت