DocumentCode
2666104
Title
An integrated database system for effective correlation analysis to improve LSI manufacturing yield
Author
Kubota, Katsutoshi ; Okubo, Tsuneo ; Takeuchi, Hideaki
Author_Institution
NTT LSI Lab., Kanagawa, Japan
fYear
1993
fDate
4-6 Oct 1993
Firstpage
91
Lastpage
96
Abstract
An integrated relational database (DB) system consisting of process, PMTEG (Process Monitoring Test Element Group), and LSI testing DBs is implemented on a high speed DB machine for effective correlation analysis. For saving DB machine disk area, only the process data necessary for correlation analyses are temporarily stored in the DB on the DB machine. The body of the process data is stored in a distributed DB on the EWSs used to control the LSI manufacturing line equipment. A correlation analysis program, which has a user-friendly window-type man-machine interface, has been developed for the integrated DB. The program retrieves data at high speed with parallel access to the DB. The total performance of the correlation analyses is improved over ten times compared with the old system that included stand-alone DBs and a PC-based correlation analysis program
Keywords
circuit optimisation; computer integrated manufacturing; correlation methods; database machines; economics; integrated circuit manufacture; integrated circuit testing; integrated circuit yield; large scale integration; process control; relational databases; LSI manufacturing yield; LSI testing; PMTEG; Process Monitoring Test Element Group; database machine disk area; effective correlation analysis; high-speed database machine; integrated database system; parallel access; relational database; user-friendly; window-type man-machine interface; Data analysis; Data processing; Database systems; Fabrication; Information retrieval; Large scale integration; Manufacturing processes; Performance analysis; System testing; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1993, Fifteenth IEEE/CHMT International
Conference_Location
Santa Clara, CA
Print_ISBN
0-7803-1424-7
Type
conf
DOI
10.1109/IEMT.1993.398217
Filename
398217
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