DocumentCode :
2666210
Title :
Wire bonding: Present and future trends
Author :
Chen, A.S. ; Nguyen, L.T. ; Burke, T.S. ; Belani, J.G.
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear :
1993
fDate :
4-6 Oct 1993
Firstpage :
45
Lastpage :
51
Abstract :
Gold wire thermosonic bonding remains the primary means of electrically connecting the silicon chip to the outside world. To keep up with the increasing interconnect density required by the ever shrinking die and with the need for package compactness, both wire and wire bonder manufacturers have made many improvements in technology. If the miniaturization trend continues at the current rate, the physical and process limits will ultimately be reached. The other possible technologies such as gold wedge bonding, tape automated bonding (TAB), and flip-chip offer some potential attractive interconnection solutions. These techniques also have their own inherent disadvantages. Until such drawbacks are resolved, the capabilities of thermosonic bonding will continue to be pushed as far as possible
Keywords :
flip-chip devices; lead bonding; packaging; reviews; tape automated bonding; technological forecasting; Au; coated wires; equipment improvements; flip-chip; miniaturization trend; process limits; tape automated bonding; thermosonic bonding; wedge bonding; wire bonding; wire materials; Bonding; Gold; Intermetallic; Lattices; Manufacturing; Motion control; Packaging machines; Plastic packaging; Semiconductor device packaging; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1993, Fifteenth IEEE/CHMT International
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-1424-7
Type :
conf
DOI :
10.1109/IEMT.1993.398223
Filename :
398223
Link To Document :
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