DocumentCode :
2666269
Title :
Viscosity sensor based on c-axis tilted AlN thin film bulk acoustic wave resonator
Author :
Qin, Lifeng ; Wang, Yizhong ; Li, Jing-Feng ; Wang, Qing-Ming
Author_Institution :
Dept. of Mech. Eng. & Mater. Sci., Univ. of Pittsburgh, Pittsburgh, PA, USA
fYear :
2011
fDate :
2-5 May 2011
Firstpage :
1
Lastpage :
4
Abstract :
It has been shown that pure thickness shear mode can be excited in thin film bulk acoustic wave resonators (FBARs) using AlN thin films with special c-axis tilt angles (46.1° and 90°). The pure shear mode FBARs may be used as sensors in liquid medium with improved sensitivity than the commonly used thickness shear mode quart crystal resonator. In this paper thickness shear mode FBAR has been investigated for viscosity sensor application. The equation for predicting electric impedance of shear mode FBARs with a liquid layer was derived from the basic piezoelectric constitutive equations. The viscosity sensitivity of AlN FBARS was achieved by calculation of resonant frequency shift due to the liquid loading layer. In the calculation, it is assumed that the FBAR is formed by AlN film with 2μm thickness, 300μm by 300μm electrode area and with mechanical quality factor of 400. Three different liquids (water, acetone and olive oil) were used as the loading layer to evaluate the sensitivity of FBAR viscosity sensors. It was found that the viscosity sensitivities of AlN FBAR with 46.1° and 90° c-axis tilted angle are very close, and do not change much with different liquid materials. The simulation results can be used for design and application of AlN FBARs.
Keywords :
III-V semiconductors; aluminium compounds; bulk acoustic wave devices; crystal resonators; quartz; sensors; thin film devices; viscosity measurement; wide band gap semiconductors; AlN; FBAR viscosity sensors; c-axis tilted thin film bulk acoustic wave resonator; electric impedance; liquid loading layer; piezoelectric constitutive equations; resonant frequency shift calculation; size 2 mum; thickness shear mode FBAR; thickness shear mode quart crystal resonator; thin film bulk acoustic wave resonators; viscosity sensitivity; Film bulk acoustic resonators; Impedance; Loading; Resonant frequency; Sensitivity; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location :
San Fransisco, CA
ISSN :
1075-6787
Print_ISBN :
978-1-61284-111-3
Type :
conf
DOI :
10.1109/FCS.2011.5977830
Filename :
5977830
Link To Document :
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