DocumentCode :
2666429
Title :
Maintenance technology for advanced avionics architecture
Author :
Rich, Barry A. ; Bartels, Bruce E. ; Cole, Merle H.
Author_Institution :
TRW Military Electron. & Avionics Div., Dayton, OH, USA
fYear :
1990
fDate :
21-25 May 1990
Firstpage :
190
Abstract :
The development of third-generation avionics architecture defined by Pave Pillar includes a variety of activities such as Joint Integrated Avionics Working Group (JIAWG) and Modular Avionics System Architecture (MASA). Included are the integrated maintenance diagnostics technologies and concepts which are essential in achieving Air Force maintainability, reliability, and support objectives for the future. One approach to meeting these objectives is the application of integrated diagnostics expert systems (IDESs), time stress measurement modules (TSMMs), and interactive maintenance system (IMS) technologies to achieve 100% fault coverage in support of the evolving maintenance concepts and procedures. The authors describe an approach for combining these technologies and evaluating the resulting fault detection/fault isolation effectiveness. The approach has been adopted in the Modular Avionics Maintenance Technology Development and Demonstration (MAMTDD) program
Keywords :
aircraft instrumentation; expert systems; fault location; maintenance engineering; military computing; military systems; reliability; Air Force maintainability; Joint Integrated Avionics Working Group; Modular Avionics System Architecture; Pave Pillar; expert systems; fault detection/fault isolation; integrated maintenance diagnostics; interactive maintenance; reliability; third-generation avionics architecture; time stress measurement modules; Aerospace electronics; Circuit faults; Computer architecture; Control systems; Isolation technology; Maintenance; Military aircraft; Military computing; Military standards; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
Conference_Location :
Dayton, OH
Type :
conf
DOI :
10.1109/NAECON.1990.112764
Filename :
112764
Link To Document :
بازگشت