Title :
Single-chip 1062 Mbaud CMOS transceiver for serial data communication
Author :
Ewen, J.F. ; Widmer, A.X. ; Soyuer, M. ; Wrenner, K.R. ; Parker, B. ; Ainspan, H.A.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
This work implements the media independent functions specified in the emerging ANSI fibre channel standard at 1062.5 Mbaud. Integrated onto a single CMOS chip are: two phase-locked loops (PLL) for clock generation and clock recovery, a selectable 1B or 2B parallel interface with corresponding multiplexer and demultiplexer for parallel-to-serial and serial-to-parallel conversion, word alignment logic for byte synchronization, 8B/l0B coder and decoder, and high-speed differential CMOS PECL drivers and receivers for the serial I/O. The chip measures 3.9/spl times/4.5 mm/sup 2/ with 100 I/O and dissipates 1.2 W at 1062 Mbaud with a 3.6 V supply. This design achieves higher-speed operation than previous CMOS work with similar integration, and lower power dissipation with higher integration than bipolar implementations at comparable speeds.
Keywords :
CMOS integrated circuits; data communication; data communication equipment; demultiplexing equipment; digital communication; mixed analogue-digital integrated circuits; multiplexing equipment; optical receivers; optical transmitters; synchronisation; time division multiplexing; timing; transceivers; 1.2 W; 3.6 V; ANSI fibre channel standard; CMOS transceiver; PLL; byte synchronization; clock generation; clock recovery; coder; decoder; demultiplexer; high-speed differential PECL drivers; media independent functions; multiplexer; parallel interface; parallel-to-serial conversion; phase-locked loops; serial data communication; serial-to-parallel conversion; word alignment logic; ANSI standards; CMOS logic circuits; Clocks; Decoding; Multiplexing; Phase locked loops; Phase measurement; Semiconductor device measurement; Synchronization; Transceivers;
Conference_Titel :
Solid-State Circuits Conference, 1995. Digest of Technical Papers. 41st ISSCC, 1995 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-2495-1
DOI :
10.1109/ISSCC.1995.535263