Title :
An integrated phase noise measurement bench for on-chip characterization of resonators and VCOs
Author :
Godet, S. ; Tournier, É ; Llopis, O. ; Cathelin, A.
Author_Institution :
LAAS, CNRS, Toulouse, France
Abstract :
A phase noise measurement bench is integrated on a 3.6 mm2 silicon chip. The bench includes a splitter with quadrature outputs, a phase detector, a low noise baseband amplifier and, if necessary, a synthesized source. Applications to the characterization of frequency sources and BAW resonators are discussed.
Keywords :
bulk acoustic wave devices; low noise amplifiers; noise measurement; phase measurement; phase noise; resonators; voltage-controlled oscillators; BAW resonators; Si; VCO; integrated phase noise measurement bench; low noise baseband amplifier; phase detector; resonator on-chip characterization; Frequency measurement; Mixers; Noise measurement; Phase measurement; Phase noise; Resonant frequency; Built-in-self-test (BIST); Phase noise; SMR resonator; integrated circuit; phase detection;
Conference_Titel :
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location :
San Fransisco, CA
Print_ISBN :
978-1-61284-111-3
DOI :
10.1109/FCS.2011.5977855
