• DocumentCode
    2666754
  • Title

    An integrated phase noise measurement bench for on-chip characterization of resonators and VCOs

  • Author

    Godet, S. ; Tournier, É ; Llopis, O. ; Cathelin, A.

  • Author_Institution
    LAAS, CNRS, Toulouse, France
  • fYear
    2011
  • fDate
    2-5 May 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A phase noise measurement bench is integrated on a 3.6 mm2 silicon chip. The bench includes a splitter with quadrature outputs, a phase detector, a low noise baseband amplifier and, if necessary, a synthesized source. Applications to the characterization of frequency sources and BAW resonators are discussed.
  • Keywords
    bulk acoustic wave devices; low noise amplifiers; noise measurement; phase measurement; phase noise; resonators; voltage-controlled oscillators; BAW resonators; Si; VCO; integrated phase noise measurement bench; low noise baseband amplifier; phase detector; resonator on-chip characterization; Frequency measurement; Mixers; Noise measurement; Phase measurement; Phase noise; Resonant frequency; Built-in-self-test (BIST); Phase noise; SMR resonator; integrated circuit; phase detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
  • Conference_Location
    San Fransisco, CA
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-61284-111-3
  • Type

    conf

  • DOI
    10.1109/FCS.2011.5977855
  • Filename
    5977855
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2666754