DocumentCode :
2666804
Title :
SAW-thin-film acoustoelectric in-situ observation and measurement
Author :
Fisher, B.H. ; Malocha, D.C.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA
fYear :
2011
fDate :
2-5 May 2011
Firstpage :
1
Lastpage :
6
Abstract :
The thin-film acoustoelectric effect in surface acoustic wave (SAW) devices describes the interaction of electrical energy between a SAW in a piezoelectric medium and a thin-film placed in the wave´s propagation path. The real-time observation of the thin-film acoustoelectric interaction is useful in the design and characterization of SAW-based thin-film chemical and physical sensors (i.e. temperature, humidity, viscosity, voltage, current, hall effects, etc.). An in-situ test fixture was designed to be mechanically, thermally and electrically stable. Data has been taken for many SAW devices and over a wide range of frequencies. The results show that the use of the in-situ procedure yielded: good agreement between theoretical predictions and the measured data, characterization a SAW-H2 gas sensor in real-time and various methods to calibrate the film deposition system and procedure. This paper presents the approach taken in configuring an electron beam evaporation system for ultra-thin-film characterization and the design of test fixtures, data acquisition configuration, and experimental procedures to extract and analyze SAW parameters in real time, and to extract the thin-film properties under test.
Keywords :
calibration; gas sensors; surface acoustic wave transducers; thin film devices; SAW-based thin-film chemical sensors; SAW-gas sensor; SAW-thin-film acoustoelectric in-situ measurement; SAW-thin-film acoustoelectric in-situ observation; data acquisition configuration; electrical energy; electron beam evaporation system; in-situ test fixture; physical sensors; surface acoustic wave devices; ultrathin-film characterization; Conductivity; Films; Fixtures; Probes; Propagation losses; Substrates; Surface acoustic waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location :
San Fransisco, CA
ISSN :
1075-6787
Print_ISBN :
978-1-61284-111-3
Type :
conf
DOI :
10.1109/FCS.2011.5977857
Filename :
5977857
Link To Document :
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