• DocumentCode
    2666933
  • Title

    TCXOs employing NS-GT cut quartz crystal resonators for cellular telephones

  • Author

    Takahashi, Eiki ; Teshigawara, Osamu ; Yamashita, Kazuo

  • Author_Institution
    Japan Radio Co. Ltd., Saitama, Japan
  • fYear
    1994
  • fDate
    1-3 Jun 1994
  • Firstpage
    594
  • Lastpage
    599
  • Abstract
    This paper describes temperature compensated crystal oscillators (TCXOs) employing new shape GT cut quartz crystal resonators (NS-GT cut resonators) to be used in cellular telephones. The NS-GT-TCXO has an oscillation frequency of 2.4 MHz and a frequency stability of ±1.5 ppm within a temperature range of -20°C to +70°C using a simplified temperature compensation method. These superior characteristics can be achieved with low current consumption (approximately 0.8 mA) and compactness (11.5 mm×8 mm×4 mm). Additionally, the phase-noise characteristics of the NS-GT-TCXO have been evaluated. The phase-noise value of the phase-locked loop circuit using the NS-GT-TCXO as a reference oscillator is approximately -70 dBc/Hz at 50 Hz offset from the 614.4 MHz carrier. This meets the requirements for use in cellular telephones. These results indicate that the miniaturization and low power consumption of the NS-GT-TCXO could have an important impact on the development of future cellular telephone systems
  • Keywords
    cellular radio; compensation; crystal oscillators; frequency stability; phase noise; radiotelephony; reference circuits; telephony; GT cut quartz crystal resonators; NS-GT cut quartz crystal resonators; TCXOs; cellular telephones; frequency stability; miniaturization; phase-locked loop circuit; phase-noise characteristics; reference oscillator; temperature compensated crystal oscillators; Capacitance; Capacitors; Ceramics; Energy consumption; Frequency; Oscillators; Stability; Telephony; Temperature distribution; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-1945-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1994.398276
  • Filename
    398276