Title :
Limited live-time measurements of frequency spectra
Author :
Howe, D.A. ; Ashby, N. ; Lirette, D. ; Hati, A. ; Nelson, C.
Author_Institution :
Time & Freq. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
Frequency-difference-of-arrival (FDOA) can be used to monitor and track an emitter´s location by observing Doppler frequency shifts of the carrier during short pulsed transmissions. This specific application needs to consider two frequency-stability levels: the short τon-average frequency measurements and the sampling time interval between measurements, denoted by τs. We show the advantage of using “dynamic” ThêoH for τon frequency measurements. Between τon transmissions while powered off, the emitter´s reference-oscillator frequency will change due to power-start thermal variations, vibration, stress, and other frequency disturbances. If we regard long-term frequency instability as an uncertainty on an oscillator´s expected or designated frequency, then the dominant error of frequency prediction is likely to be the error due to frequency drift and/or random walk FM, indicating the non-stationary behavior or disturbances. A two-sample variance is devised, called “Psi-variance,” that has desirable statistical properties similar to those of the Allan variance. From this, we compute the power spectral density of frequency fluctuations, Sy(f), from which phase noise, L(f), can be derived.
Keywords :
Doppler shift; computerised instrumentation; frequency measurement; frequency stability; oscillators; phase noise; vibrations; Doppler frequency shifts; FDOA; Psi-variance; dynamic TheoH; frequency difference-of-arrival; frequency disturbances; frequency drift; frequency spectra; frequency stability; limited live-time measurement; long-term frequency instability; phase noise; power spectral density; power-start thermal variation; reference-oscillator frequency; sampling time interval; short τon-average frequency measurement; short pulsed transmission; Frequency estimation; Frequency modulation; Noise; Oscillators; Temperature measurement; Time frequency analysis;
Conference_Titel :
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location :
San Fransisco, CA
Print_ISBN :
978-1-61284-111-3
DOI :
10.1109/FCS.2011.5977874