DocumentCode :
2667146
Title :
1/f frequency fluctuations and nonlinearity of quartz resonators and quartz crystal oscillators
Author :
Kuleshov, V.N. ; Janushevsky, G.D.
Author_Institution :
Moscow Power Eng. Inst., Russia
fYear :
1994
fDate :
1-3 Jun 1994
Firstpage :
524
Lastpage :
529
Abstract :
Levels of flicker fluctuations of VHF quartz crystal resonators parameters have been obtained from experimental data. For the same resonators nonlinear model characteristics have been measured. It turned out that resonators with unusual nonlinearity characteristics had very high levels of parameters fluctuations. The data reported in this paper are the result both in-bridge and in-oscillator measurements for 5th overtone AT-cut quartz crystal resonators operating at 140 MHz. The in-oscillator phase noise measurement results for 92 resonators are presented as functions of their unloaded Q-factors and series resistance Rs. The results show that on the average phase noise goes down when Q and 1/Rs go up. But a scattering of the phase noise levels for resonators with the same Q and Rs is more than average lowering. An approach to these results explanation and quartz resonator noise model development is suggested
Keywords :
bulk acoustic wave devices; crystal oscillators; crystal resonators; electric noise measurement; electric variables measurement; flicker noise; frequency stability; phase noise; 1/f frequency fluctuations; 140 MHz; 5th overtone AT-cut quartz crystal resonators; SiO2; VHF quartz crystal resonators; flicker fluctuations; in-bridge measurements; in-oscillator measurements; in-oscillator phase noise measurement; nonlinear model characteristics; nonlinearity; phase noise; quartz crystal oscillators; quartz resonators; series resistance; unloaded Q-factors; Active noise reduction; Electrical resistance measurement; Fluctuations; Frequency measurement; Noise level; Noise measurement; Oscillators; Phase measurement; Phase noise; Radiofrequency amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1945-1
Type :
conf
DOI :
10.1109/FREQ.1994.398288
Filename :
398288
Link To Document :
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