Title :
Towards automatic nanomanipulation at the atomic scale
Author :
Knepper, T. ; Schutz, B. ; Zhang, Jianwei ; Meyer, Christian
Author_Institution :
Dept. of Comput. Sci., Hamburg Univ.
Abstract :
Namomanipulation using atomic force or scanning tunnelling microscopy (AFM, STM) has attracted much attention among researchers in recent years. But even on an international scale, nanomanipulation is operated mostly in manual mode. A scientist carefully carries out each individual move of the manipulator tip in order to avoid a dead-end situation. The operator has to repeat similar tasks in the same tedious and error-prone way. If nanomanipulation is to come even close to fulfilling its scientific an economic potential, the bottleneck of manual operation must be eliminated. This paper presents our activities and suggestions for automatic nanomanipulation on the atomic scale
Keywords :
atomic force microscopy; micromanipulators; nanotechnology; scanning tunnelling microscopy; atomic force microscopy; atomic scale; automatic nanomanipulation; manipulator tip; scanning tunnelling microscopy; Assembly; Atomic force microscopy; Atomic measurements; Automation; Force feedback; Nanobioscience; Nanostructures; Physics; Scanning probe microscopy; User interfaces;
Conference_Titel :
Robotics and Biomimetics (ROBIO). 2005 IEEE International Conference on
Conference_Location :
Shatin
Print_ISBN :
0-7803-9315-5
DOI :
10.1109/ROBIO.2005.246408