Sapphire disk dielectric resonator temperature coefficient of frequency dependence on temperature, disk configuration and resonant mode

Author

Tsarapkin, D.P.

Author_Institution

Radio Eng. Faculty, Moscow Power Eng. Inst., Russia

fYear

1994

fDate

1-3 Jun 1994

Firstpage

447

Lastpage

450

Abstract

Results are presented for leucosapphire disk dielectric resonator temperature coefficient of frequency (TCF) dependence on temperature, disk configuration and a resonant mode type in the temperature range 70...350 K. It is found that the most intensively the enumerated factors influence resonant oscillations with HE-type polarization. The revealed TCF(T) difference for different modes permitted to build a novel long term frequency stabilization method

Keywords

circuit stability; computer aided analysis; dielectric resonators; electromagnetic wave polarisation; electronic engineering computing; sapphire; 70 to 350 K; Al₂O₃; HE-type polarization; TCF difference; disk configuration; frequency dependence; leucosapphire disk dielectric resonator; long term frequency stabilization; resonant mode; resonant oscillations; sapphire disk dielectric resonator; temperature coefficient; Dielectric losses; Electromagnetic wave polarization; Frequency dependence; Microwave oscillators; Optical polarization; Optical resonators; Optical scattering; Resonance; Temperature dependence; Temperature distribution;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International

Conference_Location

Boston, MA

Print_ISBN

0-7803-1945-1

Type

conf

DOI

10.1109/FREQ.1994.398299

Filename

398299