Title :
Temperature compensated sapphire resonator for ultra-stable oscillator capability at temperatures above 77 kelvin
Author :
Dick, G.J. ; Santiago, D.G. ; Wang, R.T.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We report on the design and test of a whispering gallery sapphire resonator for which the dominant (WGHn11) microwave mode family shows frequency-stable, compensated operation for temperatures above 77 kelvin. The resonator makes possible a new ultra-stable oscillator (USO) capability that promises performance improvements over the best available crystal quartz oscillators in a compact cryogenic package. A mechanical compensation mechanism, enabled by the difference between copper and sapphire expansion coefficients, tunes the resonator to cancel the temperature variation of sapphire´s dielectric constant. In experimental tests, the WGH811 mode showed a frequency turn-over temperature of 87 K in agreement with finite element calculations. Preliminary tests of oscillator operation show an Allan deviation of frequency variation of 1.4-6×10-12 for measuring times 1 second ⩽τ⩽100 seconds with unstabilized resonator housing temperature and a mode Q of 2×106. We project a frequency stability 10-14 for this resonator with stabilized housing temperature and with a mode Q of 107
Keywords :
compensation; crystal resonators; frequency stability; microwave oscillators; sapphire; thermal expansion; 77 K; Al2O3; Cu; Cu expansion coefficients; cryogenic package; finite element calculations; frequency stable compensated operation; frequency turn-over temperature; mechanical compensation; sapphire expansion coefficients; stabilized housing temperature; temperature compensated sapphire resonator; ultra-stable oscillator; ultra-stable oscillator capability; unstabilized resonator housing temperature; whispering gallery sapphire resonator; Copper; Cryogenics; Dielectric constant; Finite element methods; Frequency; Kelvin; Microwave oscillators; Packaging; Temperature; Testing;
Conference_Titel :
Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1945-1
DOI :
10.1109/FREQ.1994.398302