• DocumentCode
    2667620
  • Title

    A new method for estimating value at risk with EVT and HS

  • Author

    Xiaoping, Wang ; Xiangxian, Zhang ; Hongjian, Qu

  • Author_Institution
    Donghua Univ., Shanghai, China
  • fYear
    2010
  • fDate
    17-19 Sept. 2010
  • Firstpage
    283
  • Lastpage
    287
  • Abstract
    During the past decade, Value at Risk (VaR) has become one of most commonly used Tools in risk measurement. In this paper, We propose a new method for estimating VaR. Our approach combines HS method to estimate the interior and the extreme value theory to estimate the tails. This paper uses a sample of the returns of S&P 500 daily closing index to test the performance of our VaR procedure. This approach is also backtested for financial data at different confidence level. The results of the backtesting indicate that the new approach is an adequate risk measure.
  • Keywords
    investment; stock markets; EVT; S&P 500; VaR; value at risk; value theory; Biological system modeling; Distribution functions; Estimation; Indexes; Portfolios; Testing; Time series analysis; Backtesting; HS; The extreme value theory; VaR;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information and Financial Engineering (ICIFE), 2010 2nd IEEE International Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-6927-7
  • Type

    conf

  • DOI
    10.1109/ICIFE.2010.5609303
  • Filename
    5609303