DocumentCode
2667620
Title
A new method for estimating value at risk with EVT and HS
Author
Xiaoping, Wang ; Xiangxian, Zhang ; Hongjian, Qu
Author_Institution
Donghua Univ., Shanghai, China
fYear
2010
fDate
17-19 Sept. 2010
Firstpage
283
Lastpage
287
Abstract
During the past decade, Value at Risk (VaR) has become one of most commonly used Tools in risk measurement. In this paper, We propose a new method for estimating VaR. Our approach combines HS method to estimate the interior and the extreme value theory to estimate the tails. This paper uses a sample of the returns of S&P 500 daily closing index to test the performance of our VaR procedure. This approach is also backtested for financial data at different confidence level. The results of the backtesting indicate that the new approach is an adequate risk measure.
Keywords
investment; stock markets; EVT; S&P 500; VaR; value at risk; value theory; Biological system modeling; Distribution functions; Estimation; Indexes; Portfolios; Testing; Time series analysis; Backtesting; HS; The extreme value theory; VaR;
fLanguage
English
Publisher
ieee
Conference_Titel
Information and Financial Engineering (ICIFE), 2010 2nd IEEE International Conference on
Conference_Location
Chongqing
Print_ISBN
978-1-4244-6927-7
Type
conf
DOI
10.1109/ICIFE.2010.5609303
Filename
5609303
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