• DocumentCode
    2667809
  • Title

    Measurement of temperature characteristics of two-dimensional surface charge patterns of spurious modes in rectangular quartz plates

  • Author

    Watanabe, Yasuaki ; Sekimoto, Hitoshi ; Oomura, Yoshimasa

  • Author_Institution
    Fac. of Technol., Tokyo Metropolitan Univ., Japan
  • fYear
    1994
  • fDate
    1-3 Jun 1994
  • Firstpage
    255
  • Lastpage
    259
  • Abstract
    Temperature characteristics of surface charge patterns of spurious vibrations near the fundamental modes in rectangular quartz plates have been measured. The technique is based on the electrical probe method that uses piezoelectrically induced surface charge. To measure the temperature characteristics of surface charge patterns, a measurement fixture with a DUT mover is set in a computer-controlled temperature chamber and these instruments are incorporated with a network analyzer based measurement system. The measurement results using 1 and 4 MHz rectangular AT-cut quartz resonators clearly indicate that the charge distributions of a spurious vibration and a fundamental one interchange their patterns according to temperature changes
  • Keywords
    automatic test equipment; automatic testing; characteristics measurement; crystal resonators; network analysers; temperature measurement; vibration measurement; DUT mover; charge distributions; computer-controlled temperature chamber; electrical probe method; fundamental modes; network analyzer; piezoelectrically induced surface charge; rectangular AT-cut quartz resonators; rectangular quartz plates; spurious modes; spurious vibrations; temperature characteristics; two-dimensional surface charge patterns; Charge measurement; Computer networks; Current measurement; Fixtures; Instruments; Pattern analysis; Probes; Temperature distribution; Temperature measurement; Vibration measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-1945-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1994.398328
  • Filename
    398328